Course Information
| Course Unit Title |
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Thin Film Characterisation Techniques |
| Course Unit Code |
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01FEN5153 |
| Type of Course Unit |
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Optional |
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Level of Course Unit
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Second Cycle |
| Year of Study
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Preb |
| Semester
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255.Semester |
| Number of ECTS Credits Allocated
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6,00 |
| Name of Lecturer(s) |
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---
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| Course Assistants |
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---
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| Learning Outcomes of The Course Unit |
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At the end of course, students will gain general knowledge about thin film technologies and will learn capacity of thin film characterisation techniques
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| Mode of Delivery |
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Face-To-Face
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| Prerequisities and Co-requisities Courses |
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Unavailable
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| Recommended Optional Programme Components |
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Unavailable
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| Course Contents |
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This course covers general electrical, optic and structural characterisation techniques for thin films.
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Languages of Instruction |
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Turkish-English
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| Course Goals |
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In this course, main thin film characterisation techniques (electro-optic, structural characterisation) will be given. General culture about thin film technologies and applications will be given.
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Course Aims |
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To give general information about thin film characterisation techniques.
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WorkPlacement |
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classroom
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Recommended or Required Reading
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Textbook
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Advanced Characterization Techniques for Thin Film Solar Cells; Wiley-vch; Abou-Ras D; ISBN- 978-3-527-41003-3
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Additional Resources
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Handbook of Deposition Technologies for Films and Coatings, Science, Applications and Technology; Third Edition; Elsevier; Martin P. M.; ISBN?13: 978-0-8155-2031-3
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Material Sharing
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Documents
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Assignments
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Exams
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Additional Material
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Planned Learning Activities and Teaching Methods
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Lectures, Practical Courses, Presentation, Seminar, Project, Laboratory Applications (if necessary)
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ECTS / Table Of Workload (Number of ECTS credits allocated)
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Student workload surveys utilized to determine ECTS credits.
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Activity
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Course Duration (Excluding Exam Week)
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Time Of Studying Out Of Class
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Homeworks
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Presentation
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Project
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Lab Study
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Field Study
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Visas
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Finals
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Workload Hour (30)
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Total Work Charge / Hour
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Course's ECTS Credit
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Assessment Methods and Criteria
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Studies During Halfterm
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Visa
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Quiz
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Homework
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Attendance
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Application
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Lab
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Project
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Workshop
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Seminary
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Field study
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TOTAL
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The ratio of the term to success
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The ratio of final to success
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TOTAL
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Weekly Detailed Course Content
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Week
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Topics
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1
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Thin Film Technologies, an Overview
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2
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Film Thickness Measurement Techniques
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3
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XRD and structural characterisation
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4
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Adhesion and Mechanical Properties of Thin Films
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5
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Electrical Resistivity and Hall Effect Measurements
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6
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Atomic Force Microscopy
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7
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SEM I. Scanning Electron Microscopy
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8
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Raman Spectroscopy
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9
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Photoluminescence Spectroscopy
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10
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FTIR and UV Characterisations
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11
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Temperature Dependent Optical Measurements
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12
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Temperature Dependent Electrical Characterisation and Temperature Coefficient of Resistivity
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13
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Magnetic Characterization
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14
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SEM II. Energy Dispersive X-ray Analysis (EDAX, EDX)
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