SDU Education Information System
   Home   |  Login Türkçe  | English   
 
   
 
 


 
Course Information
Course Unit Title : Thin Film Characterisation Techniques
Course Unit Code : 01FEN5153
Type of Course Unit : Optional
Level of Course Unit : Second Cycle
Year of Study : Preb
Semester : 255.Semester
Number of ECTS Credits Allocated : 6,00
Name of Lecturer(s) : ---
Course Assistants : ---
Learning Outcomes of The Course Unit : At the end of course, students will gain general knowledge about thin film technologies and will learn capacity of thin film characterisation techniques
Mode of Delivery : Face-To-Face
Prerequisities and Co-requisities Courses : Unavailable
Recommended Optional Programme Components : Unavailable
Course Contents : This course covers general electrical, optic and structural characterisation techniques for thin films.
Languages of Instruction : Turkish-English
Course Goals : In this course, main thin film characterisation techniques (electro-optic, structural characterisation) will be given. General culture about thin film technologies and applications will be given.
Course Aims : To give general information about thin film characterisation techniques.
WorkPlacement   classroom
Recommended or Required Reading
Textbook : Advanced Characterization Techniques for Thin Film Solar Cells; Wiley-vch; Abou-Ras D; ISBN- 978-3-527-41003-3
Additional Resources : Handbook of Deposition Technologies for Films and Coatings, Science, Applications and Technology; Third Edition; Elsevier; Martin P. M.; ISBN?13: 978-0-8155-2031-3
Material Sharing
Documents :
Assignments :
Exams :
Additional Material :
Planned Learning Activities and Teaching Methods
Lectures, Practical Courses, Presentation, Seminar, Project, Laboratory Applications (if necessary)
ECTS / Table Of Workload (Number of ECTS credits allocated)
Student workload surveys utilized to determine ECTS credits.
Activity :
Number Duration Total  
Course Duration (Excluding Exam Week) :
14 3 42  
Time Of Studying Out Of Class :
15 4 60  
Homeworks :
3 15 45  
Presentation :
0 0 0  
Project :
0 0 0  
Lab Study :
0 0 0  
Field Study :
0 0 0  
Visas :
1 10 10  
Finals :
1 10 10  
Workload Hour (30) :
30  
Total Work Charge / Hour :
0  
Course's ECTS Credit :
0      
Assessment Methods and Criteria
Studies During Halfterm :
Number Co-Effient
Visa :
1 100
Quiz :
0 0
Homework :
0 0
Attendance :
0 0
Application :
0 0
Lab :
0 0
Project :
0 0
Workshop :
0 0
Seminary :
0 0
Field study :
0 0
   
TOTAL :
100
The ratio of the term to success :
50
The ratio of final to success :
50
TOTAL :
100
Weekly Detailed Course Content
Week Topics  
1 Thin Film Technologies, an Overview
 
2 Film Thickness Measurement Techniques
 
3 XRD and structural characterisation
 
4 Adhesion and Mechanical Properties of Thin Films
 
5 Electrical Resistivity and Hall Effect Measurements
 
6 Atomic Force Microscopy
 
7 SEM I. Scanning Electron Microscopy
 
8 Raman Spectroscopy
 
9 Photoluminescence Spectroscopy
 
10 FTIR and UV Characterisations
 
11 Temperature Dependent Optical Measurements
 
12 Temperature Dependent Electrical Characterisation and Temperature Coefficient of Resistivity
 
13 Magnetic Characterization
 
14 SEM II. Energy Dispersive X-ray Analysis (EDAX, EDX)
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0