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Course Information
Course Unit Title : Surface and Structural Characterization of Nanotechnological Materials
Course Unit Code :
Type of Course Unit : Optional
Level of Course Unit : Second Cycle
Year of Study : Preb
Semester : 255.Semester
Number of ECTS Credits Allocated : 6,00
Name of Lecturer(s) : ---
Course Assistants : ---
Learning Outcomes of The Course Unit : Know the crystal structures of the materials
Know surface types and properties of materials
Know the structural characterization methods of materials (XRD)
Know the surface characterization methods of materials (SEM and AFM)
Mode of Delivery : Face-To-Face
Prerequisities and Co-requisities Courses : Unavailable
Recommended Optional Programme Components : Unavailable
Course Contents : This course includes surface and structure properties of materials and methods used to determine these properties.
Languages of Instruction : Turkish-English
Course Goals : To learn material crystallography
To learn surface properties of materials
To learn structural characterization methods of materials
To learn surface characterization methods of materials
Course Aims : To learn the methods used for surface and structure characterization of nanotechnological materials
WorkPlacement   classroom -laboratory
Recommended or Required Reading
Textbook : Advanced Scanning Electron Microscopy and X-Ray Microanalysis [1 ed.]; E. Fiori, Joseph I. Goldstein (auth.)
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis [1 ed.]; Patrick Echlin
X-Ray Diffraction: Modern Experimental Techniques [1 ed.]; Oliver H. Seeck, Bridget Murphy
Fundamentals of Atomic Force Microscopy: Part I: Foundations; Ronald Reifenberger
Additional Resources : Advanced Scanning Electron Microscopy and X-Ray Microanalysis [1 ed.]; E. Fiori, Joseph I. Goldstein (auth.)
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis [1 ed.]; Patrick Echlin
X-Ray Diffraction: Modern Experimental Techniques [1 ed.]; Oliver H. Seeck, Bridget Murphy
Fundamentals of Atomic Force Microscopy: Part I: Foundations; Ronald Reifenberger
Material Sharing
Documents :
Assignments :
Exams :
Additional Material :
Planned Learning Activities and Teaching Methods
Lectures, Practical Courses, Presentation, Seminar, Project, Laboratory Applications (if necessary)
ECTS / Table Of Workload (Number of ECTS credits allocated)
Student workload surveys utilized to determine ECTS credits.
Activity :
Number Duration Total  
Course Duration (Excluding Exam Week) :
14 3 42  
Time Of Studying Out Of Class :
15 4 60  
Homeworks :
3 15 45  
Presentation :
0 0 0  
Project :
0 0 0  
Lab Study :
0 0 0  
Field Study :
0 0 0  
Visas :
1 10 10  
Finals :
1 10 10  
Workload Hour (30) :
30  
Total Work Charge / Hour :
0  
Course's ECTS Credit :
0      
Assessment Methods and Criteria
Studies During Halfterm :
Number Co-Effient
Visa :
1 100
Quiz :
0 0
Homework :
0 0
Attendance :
0 0
Application :
0 0
Lab :
0 0
Project :
0 0
Workshop :
0 0
Seminary :
0 0
Field study :
0 0
   
TOTAL :
100
The ratio of the term to success :
50
The ratio of final to success :
50
TOTAL :
100
Weekly Detailed Course Content
Week Topics  
1 Crystalline state
 
2 Fundamentels of Diffraction
 
3 X-Ray diffraction
 
4 Diffraction experimental techniques XRD
 
5 Powder diffraction techniques
 
6 Thin film diffraction techniques
 
7 Surface properties of materials
 
8 Scanning Electron Microscopy-I
 
9 Scanning Electron Microscopy-II
 
10 Energy-dispersive X-ray spectroscopy (EDS)
 
11 Environmental scanning electron microscopy (ESEM)
 
12 Atomic Force Microscopy AFM -I
 
13 Atomic Force Microscopy AFM -II
 
14 Next generation techniques
 
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0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
0
 
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0
 
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